Title | Analysis of AFM images of Nanofibre Mats for Automated Processing |
Publication Type | Journal Article |
Year of Publication | 2020 |
Authors | Błachowicz T, Böhm T, Grzybowski J, Domino K, Ehrmann A |
Journal | Tekstilec |
Volume | 63 |
Issue | 2 |
Start Page | 104 |
Date Published | 06/2020 |
Keywords | atomic force microscopy (AFM), electrospinning, Hurst exponent, nanofi brous mat, polyacrylonitrile (PAN), random walk |
Abstract | The image processing of pictures from fi bres and fi brous materials facilitates the investigation of diverse ge-ometrical properties, such as yarn hairiness, fi bre bifurcations or fi bre lengths and diameters. Such irregular sample sets are naturally suitable to the statistical examination of images, using a random-walk algorithm. This results in the calculation of the so-called Hurst exponent, which is the asymptotic scaling exponent of the mean squared displacement of the walker’s position. Previous investigations have proven the appropri-ateness of this method for examinations of diff erent fi bres, yarns and textile fabrics. In a recent study, we used AFM (atomic force microscopy) images, split into diff erent greyscales, to analyse and quantify diff er-ences between various nanofi bre mats created from polyacrylonitrile. In addition to the strong infl uence of the nanofi bre diameters, a certain impact of the AFM settings was also seen and must be taken into account in future research.
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URL | http://www.tekstilec.si/wp-content/uploads/2020/06/10.14502Tekstilec2020.63.104-112.pdf |
DOI | 10.14502/Tekstilec2020.63.104-112 |