Single-Device On-Site Inspection System for Non-Destructive Internal Defect Detection in Trees Near Constructed Facilities

Important information

Rejestr Instytutów Naukowych: RIN-IV-3/98

NIP: 631-011-22-45

REGON: 000564702

Skrytka ePUAP: /IITISPAN/SkrytkaESP

e-doręczenia: AE:PL-33995-65265-VDDUI-33

PIC (Participant Identification Code): 951424501

Contact us

Institute location:

ul. Bałtycka 5
44-100 Gliwice

Telephone numbers:

  • +48 32 231 73 19
  • +48 32 231 71 50
  • +48 32 330 23 89

E-mail address: office@iitis.pl

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