Hierarchical Machine Learning for IoT Anomaly Detection in SDN

Author: Amangele P.; Reed M.; Al-Naday M.; Thomos N.; Nowak M.
Conference Name: IEEE International Conference on Information Technologies InfoTech
Year of Publication: 2019
Status: Published
DOI: 10.1109/InfoTech.2019.8860878
ISBN Number: 978-1-7281-3274-7
Conference Location: Bulgaria
Publisher: IEEE
URL: https://ieeexplore.ieee.org/document/8860878